Features and Benefits:
- Extends the traditional DRC language, providing manufacturing teams a method of communicating yield and yield modeling information to the design teams.
- Determines location of the most significant yield improvement opportunities and provides graded yield metrics by issue, cell, window, etc.
- Assesses the weighted “grayscale” of features that fail to meet recommended rules.
- Assesses the weighted sensitivity to random particles using critical area analysis.
- Evaulates both recommended rules and critical area analysis in the same run deck and reviewing environment to understand trade-offs between types of analysis.
- Runs analysis directly on GDSII, OASIS, MilkyWay, and OpenAccess design databases.
- Executes and visualizes analysis from within all popular layout environments.
- Extends the infrastructure for reporting and visualization of these new statistical issues from within the design platform.