Features and Benefits
- Full-chip, high-performance, parasitic inductance extraction provides highly correlated field solver and silicon tested accuracy for analog, RF, and custom digital nanometer designs
- Powerful mutual inductance engine enables extraction of the effect of coupling between different nets
- Parasitic self-inductance extraction integrated with Calibre xRC parasitic RC extraction data enables accurate analysis of high frequency effects in nanometer technology
- Accurate extraction of frequency dependent loop inductance and resistance ensures optimized modeling of on-chip physical effects
- Efficient, realizable model order (RLC) reduction provides manageable netlists and mixed level outputs for ease of re-simulation without loss of accuracy
- Return-path selection and net based extraction frequency selection offers increased flexibility in performance and improved accuracy
- Seamless invocation, and integration to Calibre LVS, xRC, xACT 3D, and RVE, through Calibre Interactive enables cross-probing and debugging of results in popular layout environments.