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Eldo Platform delivers the required SPICE accuracy and performance to design and verify complex automotive IC designs using the BCD technology and to address their design and verification challenges efficiently and in a timely manner.

Reliability verification is made possible with Eldo’s industry-proven advanced aging simulations to predict reliability issues due to circuit degradation, electrothermal simulation to analyze thermal impact due to power dissipation, and safe operating area simulation and analysis to detect dangerous operating condition violations over the lifetime of the IC.

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Benefits and Features:

  • Comprehensive circuit analysis & diagnostics
    • Optimized performance for BCD & high-voltage processes
    • Comprehensive analog & RF analyses
    • Accurate & fast device noise analysis
    • Advanced user-defined static & dynamic SOA checks
    • Advanced Analog Characterization
  • Benefits comprehensive circuit analysis & diagnostics
    • Incremental, dynamically controlled Monte Carlo convergence
    • Monte Carlo acceleration for normal & rare events
    • Standard cell & IO characterization with Kronos
    • Native multi-threading, distributed processing
  • Industry-Proven reliability verification Solution
    • User-defined aging solution with statistical aging & aging sensitivity
    •  Single-kernel electro-thermal analysis
    • Analog defect coverage for AMSICs
  • Comprehensive mixed-signal verification with Questa ADMS
    • Full HDL/HDL-AMS language, UVM, UPF, & Matlab® support
    • Unified, coverage-driven mixed signal verification• Flexible, easy-to-use design reconfiguration